dorsal/arxiv
View SchemaDynamic phase microscopy: measurements of translational displacements at sub-nanometer scale
| Authors | V. P. Tichinsky, A. V. Kretushev, P. N. Luskinovich |
|---|---|
| Categories | |
| ArXiv ID | physics/0608093 |
| URL | https://arxiv.org/abs/physics/0608093 |
Abstract
Dynamic phase microscopy has been applied for measurements of nanometer-scale displacements of a piezoelectric scanner. This scanner, which was designed for calibration purposes for scanning probe microscopy and TEM, exhibited a linear and hysteresis-free translation in the 0.05-20 nm range. The voltage-activated motion is described by a coefficient of 0.03 \pm 0.005 nm/V.
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"abstract": "Dynamic phase microscopy has been applied for measurements of nanometer-scale\ndisplacements of a piezoelectric scanner. This scanner, which was designed for\ncalibration purposes for scanning probe microscopy and TEM, exhibited a linear\nand hysteresis-free translation in the 0.05-20 nm range. The voltage-activated\nmotion is described by a coefficient of 0.03 \\pm 0.005 nm/V.",
"arxiv_id": "physics/0608093",
"authors": [
"V. P. Tichinsky",
"A. V. Kretushev",
"P. N. Luskinovich"
],
"categories": [
"physics.ins-det",
"physics.atom-ph"
],
"title": "Dynamic phase microscopy: measurements of translational displacements at sub-nanometer scale",
"url": "https://arxiv.org/abs/physics/0608093"
},
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