{
  "annotation_id": "fc076c61-6156-49ca-b59c-8e061241a164",
  "date_created": "2026-03-02T18:01:10.322000Z",
  "date_modified": "2026-03-02T18:01:10.322000Z",
  "file_hash": "e9e1d62cd3a11898ce1a26bbc20511f656c9f25e94878300c2055debb5982478",
  "private": false,
  "record": {
    "abstract": "Dynamic phase microscopy has been applied for measurements of nanometer-scale\ndisplacements of a piezoelectric scanner. This scanner, which was designed for\ncalibration purposes for scanning probe microscopy and TEM, exhibited a linear\nand hysteresis-free translation in the 0.05-20 nm range. The voltage-activated\nmotion is described by a coefficient of 0.03 \\pm 0.005 nm/V.",
    "arxiv_id": "physics/0608093",
    "authors": [
      "V. P. Tichinsky",
      "A. V. Kretushev",
      "P. N. Luskinovich"
    ],
    "categories": [
      "physics.ins-det",
      "physics.atom-ph"
    ],
    "title": "Dynamic phase microscopy: measurements of translational displacements at   sub-nanometer scale",
    "url": "https://arxiv.org/abs/physics/0608093"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "b3cb6643-c094-4d62-8128-41bc2d714204",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}