{
  "annotation_id": "f261a35d-9175-4612-8a5e-8098d22fb196",
  "date_created": "2026-03-02T18:01:00.758000Z",
  "date_modified": "2026-03-02T18:01:00.758000Z",
  "file_hash": "3d353a4230ce130455696838696e7bf4f792ab995fdff498dce4577daa581011",
  "private": false,
  "record": {
    "abstract": "Speckle photography can be used to monitor deformations of solid surfaces.\nThe measuring characteristics, such as range or lateral resolution depend\nheavily on the optical recording and illumination set-up. This paper shows how,\nby the addition of two suitably perforated masks, the optical aperture of the\nsystem may vary from point to point, accordingly adapting the range and\nresolution to local requirements. Furthermore, by illuminating narrow areas,\nspeckle size can be chosen independently from the optical aperture, thus\nlifting an important constraint on its choice. The new technique in described\nwithin the framework of digital defocused speckle photography under normal\ncollimated illumination. Mutually limiting relations between range of\nmeasurement and spatial frequency resolution turn up both locally and when the\nwhole surface under study is considered. They are deduced and discussed in\ndetail.",
    "arxiv_id": "physics/0506200",
    "authors": [
      "Jose M. Diazdelacruz"
    ],
    "categories": [
      "physics.optics",
      "physics.ins-det"
    ],
    "doi": "10.1364/AO.46.006105",
    "journal_ref": "Applied Optics, Vol. 46, Issue 24, pp. 6105-6112 (2007)",
    "title": "Adaptive Aperture Defocused Digital Speckle Photography",
    "url": "https://arxiv.org/abs/physics/0506200"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "330d0dea-9b72-4ac9-9c11-d6fab2ee1434",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}