dorsal/arxiv
View SchemaAtom chips in the real world: the effects of wire corrugation
| Authors | Thorsten Schumm, Jèrôme Estève, Christine Aussibal, Cristina Figl, Jean-Baptiste Trebbia, Hai Nguyen, Dominique Mailly, Isabelle Bouchoule, Christopher Westbrook, Alain Aspect |
|---|---|
| Categories | |
| ArXiv ID | physics/0407094 |
| URL | https://arxiv.org/abs/physics/0407094 |
| DOI | 10.1140/epjd/e2005-00016-x |
| Journal | European Physical Journal D 32 (2005) 171-180 |
Abstract
We present a detailed model describing the effects of wire corrugation on the trapping potential experienced by a cloud of atoms above a current carrying micro wire. We calculate the distortion of the current distribution due to corrugation and then derive the corresponding roughness in the magnetic field above the wire. Scaling laws are derived for the roughness as a function of height above a ribbon shaped wire. We also present experimental data on micro wire traps using cold atoms which complement some previously published measurements and which demonstrate that wire corrugation can satisfactorily explain our observations of atom cloud fragmentation above electroplated gold wires. Finally, we present measurements of the corrugation of new wires fabricated by electron beam lithography and evaporation of gold. These wires appear to be substantially smoother than electroplated wires.
{
"annotation_id": "e264b2ed-ece6-4bd5-af7d-d88e706054b7",
"date_created": "2026-03-02T18:00:50.270000Z",
"date_modified": "2026-03-02T18:00:50.270000Z",
"file_hash": "f0aab00ef9a44ee34a3799f4473c23dc6de78955241e46f03d5ad7e44ff00d9c",
"private": false,
"record": {
"abstract": "We present a detailed model describing the effects of wire corrugation on the\ntrapping potential experienced by a cloud of atoms above a current carrying\nmicro wire. We calculate the distortion of the current distribution due to\ncorrugation and then derive the corresponding roughness in the magnetic field\nabove the wire. Scaling laws are derived for the roughness as a function of\nheight above a ribbon shaped wire. We also present experimental data on micro\nwire traps using cold atoms which complement some previously published\nmeasurements and which demonstrate that wire corrugation can satisfactorily\nexplain our observations of atom cloud fragmentation above electroplated gold\nwires. Finally, we present measurements of the corrugation of new wires\nfabricated by electron beam lithography and evaporation of gold. These wires\nappear to be substantially smoother than electroplated wires.",
"arxiv_id": "physics/0407094",
"authors": [
"Thorsten Schumm",
"J\u00e8r\u00f4me Est\u00e8ve",
"Christine Aussibal",
"Cristina Figl",
"Jean-Baptiste Trebbia",
"Hai Nguyen",
"Dominique Mailly",
"Isabelle Bouchoule",
"Christopher Westbrook",
"Alain Aspect"
],
"categories": [
"physics.atom-ph"
],
"doi": "10.1140/epjd/e2005-00016-x",
"journal_ref": "European Physical Journal D 32 (2005) 171-180",
"title": "Atom chips in the real world: the effects of wire corrugation",
"url": "https://arxiv.org/abs/physics/0407094"
},
"schema_id": "dorsal/arxiv",
"source": {
"execution_id": "5fc4d870-a583-401f-b0ec-c41071d70332",
"id": "arXiv Dataset IDs",
"type": "Model",
"variant": "snapshot-2026-03-01",
"version": "0.1.0"
},
"user_id": 1000002
}