dorsal/arxiv
View SchemaElliptical X-Ray Spot Measurement
| Authors | Roger A. Richardson, Stephen Sampayan, John T. Weir |
|---|---|
| Categories | |
| ArXiv ID | physics/0008037 |
| URL | https://arxiv.org/abs/physics/0008037 |
| Journal | eConf C000821 (2000) MOc07 |
Abstract
The so-called roll bar measurement uses a heavy metal material, optically thick to x-rays, to form a shadow of the x-ray origination spot. This spot is where an energetic electron beam interacts with a high Z target. The material (the "roll bar") is slightly curved to avoid alignment problems. The roll bar is constructed and positioned so that the x-rays are shadowed in the horizontal and vertical directions, so information is obtained in two dimensions. If a beam profile is assumed (or measured by other means), the equivalent x-ray spot size can be calculated from the x-ray shadow cast by the roll bar. Thus the ellipticity of the beam can be calculated, assuming the ellipse of the x-ray spot is aligned with the roll bar. The data is recorded using a scintillator and gated camera. Data will be presented from measurements using the ETA II induction LINAC. The accuracy of the measurement is checked using small elliptical targets.
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"abstract": "The so-called roll bar measurement uses a heavy metal material, optically\nthick to x-rays, to form a shadow of the x-ray origination spot. This spot is\nwhere an energetic electron beam interacts with a high Z target. The material\n(the \"roll bar\") is slightly curved to avoid alignment problems. The roll bar\nis constructed and positioned so that the x-rays are shadowed in the horizontal\nand vertical directions, so information is obtained in two dimensions. If a\nbeam profile is assumed (or measured by other means), the equivalent x-ray spot\nsize can be calculated from the x-ray shadow cast by the roll bar. Thus the\nellipticity of the beam can be calculated, assuming the ellipse of the x-ray\nspot is aligned with the roll bar. The data is recorded using a scintillator\nand gated camera. Data will be presented from measurements using the ETA II\ninduction LINAC. The accuracy of the measurement is checked using small\nelliptical targets.",
"arxiv_id": "physics/0008037",
"authors": [
"Roger A. Richardson",
"Stephen Sampayan",
"John T. Weir"
],
"categories": [
"physics.ins-det"
],
"journal_ref": "eConf C000821 (2000) MOc07",
"title": "Elliptical X-Ray Spot Measurement",
"url": "https://arxiv.org/abs/physics/0008037"
},
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