dorsal/arxiv
View SchemaAn optical fiber-taper probe for wafer-scale microphotonic device characterization
| Authors | C. P. Michael, M. Borselli, T. J. Johnson, C. Chrystal, O. Painter |
|---|---|
| Categories | |
| ArXiv ID | physics/0702079 |
| URL | https://arxiv.org/abs/physics/0702079 |
| DOI | 10.1364/OE.15.004745 |
Abstract
A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimpled" taper controls the probe-sample interaction length and the level of noise present during coupling measurements. Practical demonstrations with high-Q silicon microcavities include testing a dense array of undercut microdisks (maximum Q = 3.3x10^6) and a planar microring (Q = 4.8x10^6).
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"date_created": "2026-03-02T18:01:18.447000Z",
"date_modified": "2026-03-02T18:01:18.447000Z",
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"abstract": "A small depression is created in a straight optical fiber taper to form a\nlocal probe suitable for studying closely spaced, planar microphotonic devices.\nThe tension of the \"dimpled\" taper controls the probe-sample interaction length\nand the level of noise present during coupling measurements. Practical\ndemonstrations with high-Q silicon microcavities include testing a dense array\nof undercut microdisks (maximum Q = 3.3x10^6) and a planar microring (Q =\n4.8x10^6).",
"arxiv_id": "physics/0702079",
"authors": [
"C. P. Michael",
"M. Borselli",
"T. J. Johnson",
"C. Chrystal",
"O. Painter"
],
"categories": [
"physics.optics"
],
"doi": "10.1364/OE.15.004745",
"title": "An optical fiber-taper probe for wafer-scale microphotonic device characterization",
"url": "https://arxiv.org/abs/physics/0702079"
},
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