{
  "annotation_id": "c5d83122-0ff3-4e3b-b06c-a37be057396c",
  "date_created": "2026-03-02T18:00:56.883000Z",
  "date_modified": "2026-03-02T18:00:56.883000Z",
  "file_hash": "c72bbaa85535ea07fef51135048ea3665d79147d9193100116717720b03300e1",
  "private": false,
  "record": {
    "abstract": "Photoemission electron microscopy was used to image the electrons\nphotoemitted from specially tailored Ag nanoparticles deposited on a Si\nsubstrate (with its native oxide SiO$_{x}$). Photoemission was induced by\nillumination with a Hg UV-lamp (photon energy cutoff $\\hbar\\omega_{UV}=5.0$ eV,\nwavelength $\\lambda_{UV}=250$ nm) and with a Ti:Sapphire femtosecond laser\n($\\hbar\\omega_{l}=3.1$ eV, $\\lambda_{l}=400$ nm, pulse width below 200 fs),\nrespectively. While homogeneous photoelectron emission from the metal is\nobserved upon illumination at energies above the silver plasmon frequency, at\nlower photon energies the emission is localized at tips of the structure. This\nis interpreted as a signature of the local electrical field therefore providing\na tool to map the optical near field with the resolution of emission electron\nmicroscopy.",
    "arxiv_id": "physics/0505177",
    "authors": [
      "M. Cinchetti",
      "A. Gloskovskii",
      "S. A. Nepjiko",
      "G. Sch\u00f6nhense",
      "H. Rochholz",
      "M. Kreiter"
    ],
    "categories": [
      "physics.optics"
    ],
    "doi": "10.1103/PhysRevLett.95.047601",
    "title": "Photoemission Electron Microscopy as a tool for the investigation of   optical near fields",
    "url": "https://arxiv.org/abs/physics/0505177"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "787f2677-53ab-4b73-b115-c7023d2e646c",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}