dorsal/arxiv
View SchemaComment on "Negative Refractive Index in Artificial Metamaterials" [A. N. Grigorenko, Opt. Lett., 31, 2483 (2006)]
| Authors | Alexander V. Kildishev, Vladimir P. Drachev, Uday K. Chettiar, Douglas Werner, Do-Hoon Kwon, Vladimir M. Shalaev |
|---|---|
| Categories | |
| ArXiv ID | physics/0609234 |
| URL | https://arxiv.org/abs/physics/0609234 |
| DOI | 10.1364/OL.32.001510 |
Abstract
A key optical parameter characterizing the existence of negative refraction in a thin layer of a composite material is the effective refractive index of an equivalent, homogenized layer with the same physical thickness as the initial inhomogeneous composite. Measuring the complex transmission and reflection coefficients is one of the most rigorous ways to obtain this parameter. We dispute Grigorenko's statement (Optics Letters 31, 2483 (2006)) that measuring only the reflection intensity spectrum is sufficient for determining the effective refractive index. We discuss fundamental drawbacks of Grigorenko's technique of using a best-fit approximation with an a priori prescribed dispersive behavior for a given metamaterial and an 'effective optical thickness' that is smaller than the actual thickness of the sample. Our simulations do not confirm the Grigorenko paper conclusions regarding the negative refractive index and the negative permeability of the nanopillar sample in the visible spectral range.
{
"annotation_id": "c5af220f-b094-4c16-a959-c1ee317f4ee9",
"date_created": "2026-03-02T18:01:14.466000Z",
"date_modified": "2026-03-02T18:01:14.466000Z",
"file_hash": "905a9c4fe13917669a16df92bb69020687921153490e96d8f09783d6e2e57f4c",
"private": false,
"record": {
"abstract": "A key optical parameter characterizing the existence of negative refraction\nin a thin layer of a composite material is the effective refractive index of an\nequivalent, homogenized layer with the same physical thickness as the initial\ninhomogeneous composite. Measuring the complex transmission and reflection\ncoefficients is one of the most rigorous ways to obtain this parameter. We\ndispute Grigorenko\u0027s statement (Optics Letters 31, 2483 (2006)) that measuring\nonly the reflection intensity spectrum is sufficient for determining the\neffective refractive index. We discuss fundamental drawbacks of Grigorenko\u0027s\ntechnique of using a best-fit approximation with an a priori prescribed\ndispersive behavior for a given metamaterial and an \u0027effective optical\nthickness\u0027 that is smaller than the actual thickness of the sample. Our\nsimulations do not confirm the Grigorenko paper conclusions regarding the\nnegative refractive index and the negative permeability of the nanopillar\nsample in the visible spectral range.",
"arxiv_id": "physics/0609234",
"authors": [
"Alexander V. Kildishev",
"Vladimir P. Drachev",
"Uday K. Chettiar",
"Douglas Werner",
"Do-Hoon Kwon",
"Vladimir M. Shalaev"
],
"categories": [
"physics.optics"
],
"doi": "10.1364/OL.32.001510",
"title": "Comment on \"Negative Refractive Index in Artificial Metamaterials\" [A. N. Grigorenko, Opt. Lett., 31, 2483 (2006)]",
"url": "https://arxiv.org/abs/physics/0609234"
},
"schema_id": "dorsal/arxiv",
"source": {
"execution_id": "0fce0aba-7e0a-4970-b9fa-d3d06358e8c1",
"id": "arXiv Dataset IDs",
"type": "Model",
"variant": "snapshot-2026-03-01",
"version": "0.1.0"
},
"user_id": 1000002
}