{
  "annotation_id": "bc93e87a-4f25-4325-97d6-abb0b8829bb3",
  "date_created": "2026-03-02T18:00:29.218000Z",
  "date_modified": "2026-03-02T18:00:29.218000Z",
  "file_hash": "392df86ba147a8340b7ba4fa6ad3617866511e777262c66475581d063cebf643",
  "private": false,
  "record": {
    "abstract": "The second-harmonic interferometric spectroscopy (SHIS) which combines both\namplitude (intensity) and phase spectra of the second-harmonic (SH) radiation\nis proposed as a new spectroscopic technique being sensitive to the type of\ncritical points (CP\u0027s) of combined density of states at semiconductor surfaces.\nThe increased sensitivity of SHIS technique is demonstrated for the buried\nSi(111)-SiO$_2$ interface for SH photon energies from 3.6 eV to 5 eV and allows\nto separate the resonant contributions from $E^\\prime_0/E_1$, $E_2$ and\n$E^\\prime_1$ CP\u0027s of silicon.",
    "arxiv_id": "physics/0004018",
    "authors": [
      "A. A. Fedyanin",
      "T. V. Dolgova",
      "O. A. Aktsipetrov",
      "D. Schuhmacher",
      "G. Marowsky"
    ],
    "categories": [
      "physics.optics"
    ],
    "title": "Second-harmonic interferometric spectroscopy of the buried   Si(111)-SiO$_2$ interface",
    "url": "https://arxiv.org/abs/physics/0004018"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "2be50ad2-b4a6-4a53-a45e-e31af61f1612",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}