dorsal/arxiv
View SchemaFault Testing for Reversible Circuits
| Authors | Ketan N. Patel, John P. Hayes, Igor L. Markov |
|---|---|
| Categories | |
| ArXiv ID | quant-ph/0404003 |
| URL | https://arxiv.org/abs/quant-ph/0404003 |
Abstract
Applications of reversible circuits can be found in the fields of low-power computation, cryptography, communications, digital signal processing, and the emerging field of quantum computation. Furthermore, prototype circuits for low-power applications are already being fabricated in CMOS. Regardless of the eventual technology adopted, testing is sure to be an important component in any robust implementation. We consider the test set generation problem. Reversibility affects the testing problem in fundamental ways, making it significantly simpler than for the irreversible case. For example, we show that any test set that detects all single stuck-at faults in a reversible circuit also detects all multiple stuck-at faults. We present efficient test set constructions for the standard stuck-at fault model as well as the usually intractable cell-fault model. We also give a practical test set generation algorithm, based on an integer linear programming formulation, that yields test sets approximately half the size of those produced by conventional ATPG.
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"date_created": "2026-03-02T18:02:06.338000Z",
"date_modified": "2026-03-02T18:02:06.338000Z",
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"abstract": "Applications of reversible circuits can be found in the fields of low-power\ncomputation, cryptography, communications, digital signal processing, and the\nemerging field of quantum computation. Furthermore, prototype circuits for\nlow-power applications are already being fabricated in CMOS. Regardless of the\neventual technology adopted, testing is sure to be an important component in\nany robust implementation.\n We consider the test set generation problem. Reversibility affects the\ntesting problem in fundamental ways, making it significantly simpler than for\nthe irreversible case. For example, we show that any test set that detects all\nsingle stuck-at faults in a reversible circuit also detects all multiple\nstuck-at faults. We present efficient test set constructions for the standard\nstuck-at fault model as well as the usually intractable cell-fault model. We\nalso give a practical test set generation algorithm, based on an integer linear\nprogramming formulation, that yields test sets approximately half the size of\nthose produced by conventional ATPG.",
"arxiv_id": "quant-ph/0404003",
"authors": [
"Ketan N. Patel",
"John P. Hayes",
"Igor L. Markov"
],
"categories": [
"quant-ph"
],
"title": "Fault Testing for Reversible Circuits",
"url": "https://arxiv.org/abs/quant-ph/0404003"
},
"schema_id": "dorsal/arxiv",
"source": {
"execution_id": "5ac4bf2a-efdd-4f07-9e74-837b06ae9c06",
"id": "arXiv Dataset IDs",
"type": "Model",
"variant": "snapshot-2026-03-01",
"version": "0.1.0"
},
"user_id": 1000002
}