{
  "annotation_id": "b8917ea3-3c98-4f27-9b27-ef8a16b9fc16",
  "date_created": "2026-03-02T18:00:35.848000Z",
  "date_modified": "2026-03-02T18:00:35.848000Z",
  "file_hash": "3d600552c877f98f7d1dc863fb1e9835050ff1be4edb7b44d38dff4b6ba69c33",
  "private": false,
  "record": {
    "abstract": "In the past decade, the bunch lengths of electrons in accelerators have\ndecreased dramatically to the range of a few picoseconds\n\\cite{Uesaka94,Trotz97}. Measurement of the length as well as the longitudinal\nprofile of these short bunches have been a topic of research in a number of\ninstitutions \\cite{Uesaka97,Liu97,Hutchins00}. One of the techniques uses the\nelectric field induced by the passage of electrons in the vicinity of a\nbirefringent crystal to change its optical characteristics. Well-established\nelectro-optic techniques can then be used to measure the temporal\ncharacteristics of the electron bunch. In this paper we present a novel,\nnon-invasive, single-shot approach to improve the resolution to tens of\nfemtoseconds so that sub-millimeter bunch length can be measured.",
    "arxiv_id": "physics/0110052",
    "authors": [
      "Y. K. Semertzidis",
      "R. Burns",
      "V. Castillo",
      "R. Larsen",
      "D. M. Lazarus",
      "D. Nikas",
      "C. Ozben",
      "T. Srinivasan-Rao",
      "A. Stillman",
      "T. Tsang",
      "L. Kowalski"
    ],
    "categories": [
      "physics.acc-ph"
    ],
    "journal_ref": "eConf C010630 (2001) T901",
    "title": "A Single Shot, Sub-picosecond Beam Bunch Characterization with   Electro-optic Techniques",
    "url": "https://arxiv.org/abs/physics/0110052"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "d1210279-d31c-4eb3-96a4-ba2be5a8920b",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}