{
  "annotation_id": "a5e16f03-f630-48f1-95ee-5876c70c2d48",
  "date_created": "2026-03-02T18:02:44.966000Z",
  "date_modified": "2026-03-02T18:02:44.966000Z",
  "file_hash": "768c698c77a2bf22623ebcb762a67c4a0f0f1f328aea76114bb1b425a417a2cd",
  "private": false,
  "record": {
    "abstract": "We consider two different kinds of fluctuations in an ion trap potential:\nexternal fluctuating electrical fields, which cause statistical movement\n(``wobbling\u0027\u0027) of the ion relative to the center of the trap, and fluctuations\nof the spring constant, which are due to fluctuations of the ac-component of\nthe potential applied in the Paul trap for ions. We write down master equations\nfor both cases and, averaging out the noise, obtain expressions for the heating\nof the ion. We compare our results to previous results for far-off resonance\noptical traps and heating in ion traps. The effect of fluctuating external\nelectrical fields for a quantum gate operation (controlled-NOT) is determined\nand the fidelity for that operation derived.",
    "arxiv_id": "quant-ph/9812044",
    "authors": [
      "S. Schneider",
      "G. J. Milburn"
    ],
    "categories": [
      "quant-ph"
    ],
    "doi": "10.1103/PhysRevA.59.3766",
    "title": "Decoherence and fidelity in ion traps with fluctuating trap parameters",
    "url": "https://arxiv.org/abs/quant-ph/9812044"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "2ce788c0-b453-4e8c-a0f2-3f6b65642937",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}