{
  "annotation_id": "a391f97e-a4c6-4917-993c-e70de02f142e",
  "date_created": "2026-03-02T18:01:00.633000Z",
  "date_modified": "2026-03-02T18:01:00.633000Z",
  "file_hash": "61958ec626dc16d9043e87c28bcd9d5c97cbd75b716e430caace031d4d41d8f9",
  "private": false,
  "record": {
    "abstract": "In this paper, we report high-precision absolute distance and vibration\nmeasurements performed with frequency scanned interferometry using a pair of\nsingle-mode optical fibers. Absolute distance was determined by counting the\ninterference fringes produced while scanning the laser frequency. A\nhigh-finesse Fabry-Perot interferometer was used to determine frequency changes\nduring scanning. Two multiple-distance-measurement analysis techniques were\ndeveloped to improve distance precision and to extract the amplitude and\nfrequency of vibrations. Under laboratory conditions, measurement precision of\nabout 50 nm was achieved for absolute distances ranging from 0.1 meters to 0.7\nmeters by using the first multiple-distance-measurement technique. The second\nanalysis technique has the capability to measure vibration frequencies ranging\nfrom 0.1 Hz to 100 Hz with amplitude as small as a few nanometers, without a\npriori knowledge. A possible optical alignment system for a silicon tracker is\nalso presented.",
    "arxiv_id": "physics/0506197",
    "authors": [
      "Hai-Jun Yang",
      "Sven Nybery",
      "Keith Riles"
    ],
    "categories": [
      "physics.ins-det"
    ],
    "journal_ref": "ECONFC0508141:ALCPG1310,2005",
    "title": "Frequency Scanned Interferometry for ILC Tracker Alignment",
    "url": "https://arxiv.org/abs/physics/0506197"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "438cf6af-c5fc-4eb3-a72f-d9ed2500ab93",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}