dorsal/arxiv
View SchemaSpectroscopic investigations of a dielectric-surface-discharge plasma source
| Authors | R. Arad, K. Tsigutkin, Yu. V. Ralchenko, Y. Maron |
|---|---|
| Categories | |
| ArXiv ID | physics/0008092 |
| URL | https://arxiv.org/abs/physics/0008092 |
| DOI | 10.1063/1.1286801 |
| Journal | Phys. Plasmas 7, 3797 (2000) |
Abstract
Spectroscopic investigations of the properties of a plasma produced by a flashboard plasma source, commonly used in pulsed plasma experiments, are presented. The plasma is used to prefill a planar 0.4-ms-conduction time plasma opening switch (POS). A novel gas-doping technique and a secondary surface flashover plasma source are used to locally dope the plasma with gaseous and solid materials, respectively, allowing for spatially-resolved measurements. The electron density, temperature, and plasma composition are determined from spectral line intensities and line profiles. Detailed collisional-radiative modeling is used to analyze the observed line intensities. The propagation velocity and divergence angle of various ions are determined from time-of-flight measurements and Doppler broadening of spectral lines, respectively. This allows for distinguishing the secondary plasma ejected from the POS electrodes from the plasma of the flashboard source.
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"abstract": "Spectroscopic investigations of the properties of a plasma produced by a\nflashboard plasma source, commonly used in pulsed plasma experiments, are\npresented. The plasma is used to prefill a planar 0.4-ms-conduction time plasma\nopening switch (POS). A novel gas-doping technique and a secondary surface\nflashover plasma source are used to locally dope the plasma with gaseous and\nsolid materials, respectively, allowing for spatially-resolved measurements.\nThe electron density, temperature, and plasma composition are determined from\nspectral line intensities and line profiles. Detailed collisional-radiative\nmodeling is used to analyze the observed line intensities. The propagation\nvelocity and divergence angle of various ions are determined from\ntime-of-flight measurements and Doppler broadening of spectral lines,\nrespectively. This allows for distinguishing the secondary plasma ejected from\nthe POS electrodes from the plasma of the flashboard source.",
"arxiv_id": "physics/0008092",
"authors": [
"R. Arad",
"K. Tsigutkin",
"Yu. V. Ralchenko",
"Y. Maron"
],
"categories": [
"physics.plasm-ph",
"physics.atom-ph"
],
"doi": "10.1063/1.1286801",
"journal_ref": "Phys. Plasmas 7, 3797 (2000)",
"title": "Spectroscopic investigations of a dielectric-surface-discharge plasma source",
"url": "https://arxiv.org/abs/physics/0008092"
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