{
  "annotation_id": "997fd34c-9955-40bc-82f8-4a896c1bfe26",
  "date_created": "2026-03-02T18:02:19.958000Z",
  "date_modified": "2026-03-02T18:02:19.958000Z",
  "file_hash": "2515ccf12bd8244ea7a909c813cdd810d40b17e303db65842ddf63fb253900b4",
  "private": false,
  "record": {
    "abstract": "We point out a general framework that encompasses most cases in which quantum\neffects enable an increase in precision when estimating a parameter (quantum\nmetrology). The typical quantum precision-enhancement is of the order of the\nsquare root of the number of times the system is sampled. We prove that this is\noptimal and we point out the different strategies (classical and quantum) that\npermit to attain this bound.",
    "arxiv_id": "quant-ph/0509179",
    "authors": [
      "Vittorio Giovannetti",
      "Seth Lloyd",
      "Lorenzo Maccone"
    ],
    "categories": [
      "quant-ph"
    ],
    "doi": "10.1103/PhysRevLett.96.010401",
    "journal_ref": "Phys. Rev. Lett. 96, 010401 (2006)",
    "title": "Quantum metrology",
    "url": "https://arxiv.org/abs/quant-ph/0509179"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "1f038718-d763-4bc6-8e04-96358c1f7d61",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}