dorsal/arxiv
View SchemaQuantum metrology
| Authors | Vittorio Giovannetti, Seth Lloyd, Lorenzo Maccone |
|---|---|
| Categories | |
| ArXiv ID | quant-ph/0509179 |
| URL | https://arxiv.org/abs/quant-ph/0509179 |
| DOI | 10.1103/PhysRevLett.96.010401 |
| Journal | Phys. Rev. Lett. 96, 010401 (2006) |
Abstract
We point out a general framework that encompasses most cases in which quantum effects enable an increase in precision when estimating a parameter (quantum metrology). The typical quantum precision-enhancement is of the order of the square root of the number of times the system is sampled. We prove that this is optimal and we point out the different strategies (classical and quantum) that permit to attain this bound.
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"abstract": "We point out a general framework that encompasses most cases in which quantum\neffects enable an increase in precision when estimating a parameter (quantum\nmetrology). The typical quantum precision-enhancement is of the order of the\nsquare root of the number of times the system is sampled. We prove that this is\noptimal and we point out the different strategies (classical and quantum) that\npermit to attain this bound.",
"arxiv_id": "quant-ph/0509179",
"authors": [
"Vittorio Giovannetti",
"Seth Lloyd",
"Lorenzo Maccone"
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],
"doi": "10.1103/PhysRevLett.96.010401",
"journal_ref": "Phys. Rev. Lett. 96, 010401 (2006)",
"title": "Quantum metrology",
"url": "https://arxiv.org/abs/quant-ph/0509179"
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