dorsal/arxiv
View SchemaTest Results on the Silicon Pixel Detector for the TTF-FEL Beam Trajectory Monitor
| Authors | S. Hillert, R. Ischebeck, U. C. Müller, S. Roth, K. Hansen, P. Holl, S. Karstensen, J. Kemmer, R. Klanner, P. Lechner, M. Leenen, J. S. T. Ng, P. Schmüser, L. Strüder |
|---|---|
| Categories | |
| ArXiv ID | physics/0004063 |
| URL | https://arxiv.org/abs/physics/0004063 |
| DOI | 10.1016/S0168-9002(00)00898-6 |
| Journal | Nucl.Instrum.Meth.A458:710-719,2001 |
Abstract
Test measurements on the silicon pixel detector for the beam trajectory monitor at the free electron laser of the TESLA test facility are presented. To determine the electronic noise of detector and read-out and to calibrate the signal amplitude of different pixels the 6 keV photons of the manganese K line are used. Two different methods determine the spatial accuracy of the detector: In one setup a laser beam is focused to a straight line and moved across the pixel structure. In the other the detector is scanned using a low-intensity electron beam of an electron microscope. Both methods show that the symmetry axis of the detector defines a straight line within 0.4 microns. The sensitivity of the detector to low energy X-rays is measured using a vacuum ultraviolet beam at the synchrotron light source HASYLAB. Additionally, the electron microscope is used to study the radiation hardness of the detector.
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"abstract": "Test measurements on the silicon pixel detector for the beam trajectory\nmonitor at the free electron laser of the TESLA test facility are presented. To\ndetermine the electronic noise of detector and read-out and to calibrate the\nsignal amplitude of different pixels the 6 keV photons of the manganese K line\nare used. Two different methods determine the spatial accuracy of the detector:\nIn one setup a laser beam is focused to a straight line and moved across the\npixel structure. In the other the detector is scanned using a low-intensity\nelectron beam of an electron microscope. Both methods show that the symmetry\naxis of the detector defines a straight line within 0.4 microns. The\nsensitivity of the detector to low energy X-rays is measured using a vacuum\nultraviolet beam at the synchrotron light source HASYLAB. Additionally, the\nelectron microscope is used to study the radiation hardness of the detector.",
"arxiv_id": "physics/0004063",
"authors": [
"S. Hillert",
"R. Ischebeck",
"U. C. M\u00fcller",
"S. Roth",
"K. Hansen",
"P. Holl",
"S. Karstensen",
"J. Kemmer",
"R. Klanner",
"P. Lechner",
"M. Leenen",
"J. S. T. Ng",
"P. Schm\u00fcser",
"L. Str\u00fcder"
],
"categories": [
"physics.acc-ph"
],
"doi": "10.1016/S0168-9002(00)00898-6",
"journal_ref": "Nucl.Instrum.Meth.A458:710-719,2001",
"title": "Test Results on the Silicon Pixel Detector for the TTF-FEL Beam Trajectory Monitor",
"url": "https://arxiv.org/abs/physics/0004063"
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