dorsal/arxiv
View SchemaAn assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy
| Authors | M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz E. Lima, S. Marchesini, H. Miao, D. Sayre, D. A. Shapiro, J. C. H. Spence |
|---|---|
| Categories | |
| ArXiv ID | physics/0502059 |
| URL | https://arxiv.org/abs/physics/0502059 |
| DOI | 10.1016/j.elspec.2008.10.008 |
| Journal | Journ. of El. Spect. & Rel. Phen. 170, pp 4-12 (2009). |
Abstract
X-ray diffraction microscopy (XDM) is a new form of x-ray imaging that is being practiced at several third-generation synchrotron-radiation x-ray facilities. Although only five years have elapsed since the technique was first introduced, it has made rapid progress in demonstrating high-resolution threedimensional imaging and promises few-nm resolution with much larger samples than can be imaged in the transmission electron microscope. Both life- and materials-science applications of XDM are intended, and it is expected that the principal limitation to resolution will be radiation damage for life science and the coherent power of available x-ray sources for material science. In this paper we address the question of the role of radiation damage. We use a statistical analysis based on the so-called "dose fractionation theorem" of Hegerl and Hoppe to calculate the dose needed to make an image of a lifescience sample by XDM with a given resolution. We conclude that the needed dose scales with the inverse fourth power of the resolution and present experimental evidence to support this finding. To determine the maximum tolerable dose we have assembled a number of data taken from the literature plus some measurements of our own which cover ranges of resolution that are not well covered by reports in the literature. The tentative conclusion of this study is that XDM should be able to image frozen-hydrated protein samples at a resolution of about 10 nm with "Rose-criterion" image quality.
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"abstract": "X-ray diffraction microscopy (XDM) is a new form of x-ray imaging that is\nbeing practiced at several third-generation synchrotron-radiation x-ray\nfacilities. Although only five years have elapsed since the technique was first\nintroduced, it has made rapid progress in demonstrating high-resolution\nthreedimensional imaging and promises few-nm resolution with much larger\nsamples than can be imaged in the transmission electron microscope. Both life-\nand materials-science applications of XDM are intended, and it is expected that\nthe principal limitation to resolution will be radiation damage for life\nscience and the coherent power of available x-ray sources for material science.\nIn this paper we address the question of the role of radiation damage. We use a\nstatistical analysis based on the so-called \"dose fractionation theorem\" of\nHegerl and Hoppe to calculate the dose needed to make an image of a lifescience\nsample by XDM with a given resolution. We conclude that the needed dose scales\nwith the inverse fourth power of the resolution and present experimental\nevidence to support this finding. To determine the maximum tolerable dose we\nhave assembled a number of data taken from the literature plus some\nmeasurements of our own which cover ranges of resolution that are not well\ncovered by reports in the literature. The tentative conclusion of this study is\nthat XDM should be able to image frozen-hydrated protein samples at a\nresolution of about 10 nm with \"Rose-criterion\" image quality.",
"arxiv_id": "physics/0502059",
"authors": [
"M. R. Howells",
"T. Beetz",
"H. N. Chapman",
"C. Cui",
"J. M. Holton",
"C. J. Jacobsen",
"J. Kirz E. Lima",
"S. Marchesini",
"H. Miao",
"D. Sayre",
"D. A. Shapiro",
"J. C. H. Spence"
],
"categories": [
"physics.optics",
"cond-mat.mtrl-sci"
],
"doi": "10.1016/j.elspec.2008.10.008",
"journal_ref": "Journ. of El. Spect. \u0026 Rel. Phen. 170, pp 4-12 (2009).",
"title": "An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy",
"url": "https://arxiv.org/abs/physics/0502059"
},
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