dorsal/arxiv
View SchemaMeasurements of RF Cavity Voltages by X-ray Spectrum Measurements
| Authors | J. P. Duke, A. P. Letchford, D. J. S. Findlay |
|---|---|
| Categories | |
| ArXiv ID | physics/0008024 |
| URL | https://arxiv.org/abs/physics/0008024 |
| Journal | eConf C000821 (2000) MOc08 |
Abstract
Measurement of the endpoints of X-ray spectra emitted from RF cavities is a useful non-invasive technique for measuring peak voltages within the cavities. The matching of calculated X-ray spectra to measured spectra is described, with emphasis upon the endpoint region.
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"abstract": "Measurement of the endpoints of X-ray spectra emitted from RF cavities is a\nuseful non-invasive technique for measuring peak voltages within the cavities.\nThe matching of calculated X-ray spectra to measured spectra is described, with\nemphasis upon the endpoint region.",
"arxiv_id": "physics/0008024",
"authors": [
"J. P. Duke",
"A. P. Letchford",
"D. J. S. Findlay"
],
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"journal_ref": "eConf C000821 (2000) MOc08",
"title": "Measurements of RF Cavity Voltages by X-ray Spectrum Measurements",
"url": "https://arxiv.org/abs/physics/0008024"
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