{
  "annotation_id": "70c4e2b2-b3b1-466e-ac17-fb41e944524d",
  "date_created": "2026-03-02T18:02:13.042000Z",
  "date_modified": "2026-03-02T18:02:13.042000Z",
  "file_hash": "a410cee3d43832f5fecf886c95b13144d3ceff0f627d8bcb412488e9fd11d1e0",
  "private": false,
  "record": {
    "abstract": "Test pattern generation is an electronic design automation tool that attempts\nto find an input (or test) sequence that, when applied to a digital circuit,\nenables one to distinguish between the correct circuit behavior and the faulty\nbehavior caused by particular faults. The effectiveness of this classical\nmethod is measured by the fault coverage achieved for the fault model and the\nnumber of generated vectors, which should be directly proportional to test\napplication time. This work address the quantum process validation problem by\nconsidering the quantum mechanical adaptation of test pattern generation\nmethods used to test classical circuits. We found that quantum mechanics allows\none to execute multiple test vectors concurrently, making each gate realized in\nthe process act on a complete set of characteristic states in space/time\ncomplexity that breaks classical testability lower bounds.",
    "arxiv_id": "quant-ph/0501108",
    "authors": [
      "Jacob Biamonte",
      "Marek Perkowski"
    ],
    "categories": [
      "quant-ph"
    ],
    "journal_ref": "IET Circuits, Devices \u0026 Systems 2010",
    "license": "http://arxiv.org/licenses/nonexclusive-distrib/1.0/",
    "title": "Fault testing quantum switching circuits",
    "url": "https://arxiv.org/abs/quant-ph/0501108"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "35a3d018-5e56-46c6-8c42-4af899520b89",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}