{
  "annotation_id": "6aad2e70-9c56-44fb-a033-2e307fe7ce5b",
  "date_created": "2026-03-02T18:00:50.375000Z",
  "date_modified": "2026-03-02T18:00:50.375000Z",
  "file_hash": "4678cda0d8c16aa2499f9e6b5e91e6175059dd83c29a54064257b29abfa21305",
  "private": false,
  "record": {
    "abstract": "High refractive index contrast optical microdisk resonators fabricated from\nsilicon-on-insulator wafers are studied using an external silica fiber taper\nwaveguide as a wafer-scale optical probe. Measurements performed in the 1500 nm\nwavelength band show that these silicon microdisks can support\nwhispering-gallery modes with quality factors as high as 5.2 x 10^5, limited by\nRayleigh scattering from fabrication induced surface roughness. Microdisks with\nradii as small as 2.5 microns are studied, with measured quality factors as\nhigh as 4.7 x 10^5 for an optical mode volume of 5.3 cubic wavelengths in the\nmaterial.",
    "arxiv_id": "physics/0406101",
    "authors": [
      "Matthew Borselli",
      "Kartik Srinivasan",
      "Paul E. Barclay",
      "Oskar Painter"
    ],
    "categories": [
      "physics.optics"
    ],
    "doi": "10.1063/1.1811378",
    "journal_ref": "App. Phys. Lett., v85(17), pp. 3693-3695, Oct. 25, 2004",
    "title": "Rayleigh scattering, mode coupling, and optical loss in silicon   microdisks",
    "url": "https://arxiv.org/abs/physics/0406101"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "c1760190-e11d-49ee-a3bd-35fb65c57342",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}