{
  "annotation_id": "49447564-fda0-41b0-b32f-73ad1c293e67",
  "date_created": "2026-03-02T18:01:10.607000Z",
  "date_modified": "2026-03-02T18:01:10.607000Z",
  "file_hash": "81b0a6d380164ad75b0813655b68b88a61adfb54801efe8b79a9c7733187f7c2",
  "private": false,
  "record": {
    "abstract": "A novel technique to identify small fluxes of mixed highly charged ion beams\nextracted from an Electron Beam Ion Trap (EBIT) is presented and practically\ndemonstrated. The method exploits projectile charge state dependent potential\nemission of electrons as induced by ion impact on a metal surface to separate\nions with identical or very similar mass-to-charge ratio.",
    "arxiv_id": "physics/0606195",
    "authors": [
      "W. Meissl",
      "M. C. Simon",
      "J. R. Crespo Lopez-Urrutia",
      "H. Tawara",
      "J. Ullrich",
      "HP. Winter",
      "F. Aumayr"
    ],
    "categories": [
      "physics.atom-ph"
    ],
    "doi": "10.1063/1.2238856",
    "title": "A novel method for unambiguous ion identification in mixed ion beams   extracted from an EBIT",
    "url": "https://arxiv.org/abs/physics/0606195"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "48762d58-3db4-4ccc-b37c-bd0ce20e9d19",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}