{
  "annotation_id": "38fa1e26-e39a-4584-a286-7052fdf1a6fa",
  "date_created": "2026-03-02T18:00:43.004000Z",
  "date_modified": "2026-03-02T18:00:43.004000Z",
  "file_hash": "549431d2a568005baddb05ca1c6fe77aeedd8b3c30c9153e8d9718062a47687c",
  "private": false,
  "record": {
    "abstract": "We describe a self calibrating optical technique that allows to perform\nabsolute measurements of scattering cross sections for the light scattered at\nextremely small angles. Very good performances are obtained by using a very\nsimple optical layout similar to that used for the schlieren method, a\ntechnique traditionally used for mapping local refraction index changes. The\nscattered intensity distribution is recovered by a statistical analysis of the\nrandom interference of the light scattered in a half-plane of the scattering\nwave vectors and the main transmitted beam. High quality data can be obtained\nby proper statistical accumulation of scattered intensity frames, and the\nstatic stray light contributions can be eliminated rigorously. The\npotentialities of the method are tested in a scattering experiment from non\nequilibrium fluctuations during a free diffusion experiment. Contributions of\nlight scattered from length scales as long as Lambda=1 mm can be accurately\ndetermined.",
    "arxiv_id": "physics/0305101",
    "authors": [
      "Doriano Brogioli",
      "Alberto Vailati",
      "Marzio Giglio"
    ],
    "categories": [
      "physics.optics",
      "physics.flu-dyn"
    ],
    "doi": "10.1209/epl/i2003-00519-4",
    "journal_ref": "Europhys. Lett. 63, 220 (2003)",
    "title": "A schlieren method for ultra-low angle light scattering measurements",
    "url": "https://arxiv.org/abs/physics/0305101"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "ecf4776f-d9de-4ba9-9b45-ce0b5e16b7fc",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}