{
  "annotation_id": "35421c1c-9306-4adc-846e-f053fcdd7765",
  "date_created": "2026-03-02T18:02:24.203000Z",
  "date_modified": "2026-03-02T18:02:24.203000Z",
  "file_hash": "c20dc000965962d2cf1f298b3a9c6e40bc46163a3f08db2bea05ba7e39f8083d",
  "private": false,
  "record": {
    "abstract": "We demonstrate a method for loading surface electrode ion traps by electron\nimpact ionization. The method relies on the property of surface electrode\ngeometries that the trap depth can be increased at the cost of more\nmicromotion. By introducing a buffer gas, we can counteract the rf heating\nassocated with the micromotion and benefit from the larger trap depth. After an\ninitial loading of the trap, standard compensation techniques can be used to\ncancel the stray fields resulting from charged dielectric and allow for the\nloading of the trap at ultra-high vacuum.",
    "arxiv_id": "quant-ph/0603142",
    "authors": [
      "Kenneth R. Brown",
      "Robert J. Clark",
      "Jaroslaw Labaziewicz",
      "Philip Richerme",
      "David R. Leibrandt",
      "Isaac L. Chuang"
    ],
    "categories": [
      "quant-ph"
    ],
    "doi": "10.1103/PhysRevA.75.015401",
    "title": "Electron impact ionization loading of a surface electrode ion trap",
    "url": "https://arxiv.org/abs/quant-ph/0603142"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "db51c5ea-477a-4bf7-8be5-3ad23351aba3",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}