dorsal/arxiv
View SchemaElectron-ion-ion coincidence experiments for photofragmentation of polyatomic molecules using pulsed electric fields: treatment of random coincidences
| Authors | G. Pruemper, K. Ueda |
|---|---|
| Categories | |
| ArXiv ID | physics/0702032 |
| URL | https://arxiv.org/abs/physics/0702032 |
Abstract
In molecular photofragmentation processes by soft X-rays, a number of ionic fragments can be produced, each having a different abundance and correlation with the emitted electron kinetic energy. For investigating these fragmentation processes, electron-ion and electron-ion-ion coincidence experiments, in which the kinetic energy of electrons are analyzed using an electrostatic analyzer while the mass of the ions is analyzed using a pulsed electric field, are very powerful. For such measurements, however, the contribution of random coincidences is substantial and affects the data in a non-trivial way. Simple intuitive subtraction methods cannot be applied. In the present paper, we describe these electron-ion and electron-ion-ion coincidence experiments together with a subtraction method for the contribution from random coincidences. We provide a comprehensive set of equations for the data treatment, including equations for the calculation of error-bars. We demonstrate the method by applying it to the fragmentation of free CF$_3$SF$_5$ molecules.
{
"annotation_id": "30201e95-f91f-40c7-8918-86c0e3f5db87",
"date_created": "2026-03-02T18:01:17.694000Z",
"date_modified": "2026-03-02T18:01:17.694000Z",
"file_hash": "337f6f2952e8f481b77f5d1f765bea20d4aa51160df3066761545deff4e25d78",
"private": false,
"record": {
"abstract": "In molecular photofragmentation processes by soft X-rays, a number of ionic\nfragments can be produced, each having a different abundance and correlation\nwith the emitted electron kinetic energy. For investigating these fragmentation\nprocesses, electron-ion and electron-ion-ion coincidence experiments, in which\nthe kinetic energy of electrons are analyzed using an electrostatic analyzer\nwhile the mass of the ions is analyzed using a pulsed electric field, are very\npowerful. For such measurements, however, the contribution of random\ncoincidences is substantial and affects the data in a non-trivial way. Simple\nintuitive subtraction methods cannot be applied. In the present paper, we\ndescribe these electron-ion and electron-ion-ion coincidence experiments\ntogether with a subtraction method for the contribution from random\ncoincidences. We provide a comprehensive set of equations for the data\ntreatment, including equations for the calculation of error-bars. We\ndemonstrate the method by applying it to the fragmentation of free CF$_3$SF$_5$\nmolecules.",
"arxiv_id": "physics/0702032",
"authors": [
"G. Pruemper",
"K. Ueda"
],
"categories": [
"physics.atom-ph",
"physics.ins-det"
],
"title": "Electron-ion-ion coincidence experiments for photofragmentation of polyatomic molecules using pulsed electric fields: treatment of random coincidences",
"url": "https://arxiv.org/abs/physics/0702032"
},
"schema_id": "dorsal/arxiv",
"source": {
"execution_id": "b362a40e-3017-4007-8b6c-b8d3674ef394",
"id": "arXiv Dataset IDs",
"type": "Model",
"variant": "snapshot-2026-03-01",
"version": "0.1.0"
},
"user_id": 1000002
}