dorsal/arxiv
View SchemaOptical loss and lasing characteristics of high-quality-factor AlGaAs microdisk resonators with embedded quantum dots
| Authors | Kartik Srinivasan, Matthew Borselli, Thomas J. Johnson, Paul E. Barclay, Oskar Painter, Andreas Stintz, Sanjay Krishna |
|---|---|
| Categories | |
| ArXiv ID | quant-ph/0412085 |
| URL | https://arxiv.org/abs/quant-ph/0412085 |
| DOI | 10.1063/1.1901810 |
| Journal | Appl. Phys. Lett., Vol 86, 151106 (2005) |
Abstract
Optical characterization of AlGaAs microdisk resonant cavities with a quantum dot active region is presented. Direct passive measurement of the optical loss within AlGaAs microdisk resonant structures embedded with InAs/InGaAs dots-in-a-well (DWELL) is performed using an optical-fiber-based probing technique at a wavelength (lambda~1400 nm) that is red-detuned from the dot emission wavelength (lambda~1200 nm). Measurements in the 1400 nm wavelength band on microdisks of diameter D = 4.5 microns show that these structures support modes with cold-cavity quality factors as high as 360,000. DWELL-containing microdisks are then studied through optical pumping at room temperature. Pulsed lasing at lambda ~ 1200 nm is seen for cavities containing a single layer of InAs dots, with threshold values of ~ 17 microWatts, approaching the estimated material transparency level. Room-temperature continuous wave operation is also observed.
{
"annotation_id": "230a3c87-06a3-49f2-b943-e300423bd638",
"date_created": "2026-03-02T18:02:13.687000Z",
"date_modified": "2026-03-02T18:02:13.687000Z",
"file_hash": "6f78f0c729c0e5a7f89ae0620d24e9a546b51efa8d8edb174cb9f29fc745e455",
"private": false,
"record": {
"abstract": "Optical characterization of AlGaAs microdisk resonant cavities with a quantum\ndot active region is presented. Direct passive measurement of the optical loss\nwithin AlGaAs microdisk resonant structures embedded with InAs/InGaAs\ndots-in-a-well (DWELL) is performed using an optical-fiber-based probing\ntechnique at a wavelength (lambda~1400 nm) that is red-detuned from the dot\nemission wavelength (lambda~1200 nm). Measurements in the 1400 nm wavelength\nband on microdisks of diameter D = 4.5 microns show that these structures\nsupport modes with cold-cavity quality factors as high as 360,000.\nDWELL-containing microdisks are then studied through optical pumping at room\ntemperature. Pulsed lasing at lambda ~ 1200 nm is seen for cavities containing\na single layer of InAs dots, with threshold values of ~ 17 microWatts,\napproaching the estimated material transparency level. Room-temperature\ncontinuous wave operation is also observed.",
"arxiv_id": "quant-ph/0412085",
"authors": [
"Kartik Srinivasan",
"Matthew Borselli",
"Thomas J. Johnson",
"Paul E. Barclay",
"Oskar Painter",
"Andreas Stintz",
"Sanjay Krishna"
],
"categories": [
"quant-ph",
"physics.optics"
],
"doi": "10.1063/1.1901810",
"journal_ref": "Appl. Phys. Lett., Vol 86, 151106 (2005)",
"title": "Optical loss and lasing characteristics of high-quality-factor AlGaAs microdisk resonators with embedded quantum dots",
"url": "https://arxiv.org/abs/quant-ph/0412085"
},
"schema_id": "dorsal/arxiv",
"source": {
"execution_id": "27893019-bb7c-48a6-9bd7-070c6132ffdf",
"id": "arXiv Dataset IDs",
"type": "Model",
"variant": "snapshot-2026-03-01",
"version": "0.1.0"
},
"user_id": 1000002
}