dorsal/arxiv
View SchemaFault Models for Quantum Mechanical Switching Networks
| Authors | Jacob Biamonte, Jeff S. Allen, Marek A. Perkowski |
|---|---|
| Categories | |
| ArXiv ID | quant-ph/0508147 |
| URL | https://arxiv.org/abs/quant-ph/0508147 |
| DOI | 10.1007/s10836-010-5171-x |
| Journal | Journal of Electronic Testing: Theory and Applications, 26(5):499-511, (2010) |
| License | http://arxiv.org/licenses/nonexclusive-distrib/1.0/ |
Abstract
The difference between faults and errors is that, unlike faults, errors can be corrected using control codes. In classical test and verification one develops a test set separating a correct circuit from a circuit containing any considered fault. Classical faults are modelled at the logical level by fault models that act on classical states. The stuck fault model, thought of as a lead connected to a power rail or to a ground, is most typically considered. A classical test set complete for the stuck fault model propagates both binary basis states, 0 and 1, through all nodes in a network and is known to detect many physical faults. A classical test set complete for the stuck fault model allows all circuit nodes to be completely tested and verifies the function of many gates. It is natural to ask if one may adapt any of the known classical methods to test quantum circuits. Of course, classical fault models do not capture all the logical failures found in quantum circuits. The first obstacle faced when using methods from classical test is developing a set of realistic quantum-logical fault models. Developing fault models to abstract the test problem away from the device level motivated our study. Several results are established. First, we describe typical modes of failure present in the physical design of quantum circuits. From this we develop fault models for quantum binary circuits that enable testing at the logical level. The application of these fault models is shown by adapting the classical test set generation technique known as constructing a fault table to generate quantum test sets. A test set developed using this method is shown to detect each of the considered faults.
{
"annotation_id": "1f26e713-a173-4f85-8913-c5cf9c601e6c",
"date_created": "2026-03-02T18:02:20.777000Z",
"date_modified": "2026-03-02T18:02:20.777000Z",
"file_hash": "2366ec2c0becc4458c1a1b73a525fac513b1fdcf29ad6b5ce84e585dd315eddb",
"private": false,
"record": {
"abstract": "The difference between faults and errors is that, unlike faults, errors can\nbe corrected using control codes. In classical test and verification one\ndevelops a test set separating a correct circuit from a circuit containing any\nconsidered fault. Classical faults are modelled at the logical level by fault\nmodels that act on classical states. The stuck fault model, thought of as a\nlead connected to a power rail or to a ground, is most typically considered. A\nclassical test set complete for the stuck fault model propagates both binary\nbasis states, 0 and 1, through all nodes in a network and is known to detect\nmany physical faults. A classical test set complete for the stuck fault model\nallows all circuit nodes to be completely tested and verifies the function of\nmany gates. It is natural to ask if one may adapt any of the known classical\nmethods to test quantum circuits. Of course, classical fault models do not\ncapture all the logical failures found in quantum circuits. The first obstacle\nfaced when using methods from classical test is developing a set of realistic\nquantum-logical fault models. Developing fault models to abstract the test\nproblem away from the device level motivated our study. Several results are\nestablished. First, we describe typical modes of failure present in the\nphysical design of quantum circuits. From this we develop fault models for\nquantum binary circuits that enable testing at the logical level. The\napplication of these fault models is shown by adapting the classical test set\ngeneration technique known as constructing a fault table to generate quantum\ntest sets. A test set developed using this method is shown to detect each of\nthe considered faults.",
"arxiv_id": "quant-ph/0508147",
"authors": [
"Jacob Biamonte",
"Jeff S. Allen",
"Marek A. Perkowski"
],
"categories": [
"quant-ph"
],
"doi": "10.1007/s10836-010-5171-x",
"journal_ref": "Journal of Electronic Testing: Theory and Applications,\n 26(5):499-511, (2010)",
"license": "http://arxiv.org/licenses/nonexclusive-distrib/1.0/",
"title": "Fault Models for Quantum Mechanical Switching Networks",
"url": "https://arxiv.org/abs/quant-ph/0508147"
},
"schema_id": "dorsal/arxiv",
"source": {
"execution_id": "1660df2f-d612-44ba-95df-e535e81508cb",
"id": "arXiv Dataset IDs",
"type": "Model",
"variant": "snapshot-2026-03-01",
"version": "0.1.0"
},
"user_id": 1000002
}