{
  "annotation_id": "1842f644-af92-4a20-8db1-ad2f24191eff",
  "date_created": "2026-03-02T18:00:43.016000Z",
  "date_modified": "2026-03-02T18:00:43.016000Z",
  "file_hash": "6aab6cdb9c5bcda544311c374c70ac5073821bb53e0922eb3dd47f1557c46a37",
  "private": false,
  "record": {
    "abstract": "We perform numerical studies of the effect of sidewall imperfections on the\nresonant state broadening of the optical microdisk cavities for lasing\napplications. We demonstrate that even small edge roughness causes a drastic\ndegradation of high-Q whispering gallery (WG) mode resonances reducing their\nQ-values by many orders of magnitude. At the same time, low-Q WG resonances are\nrather insensitive to the surface roughness. The results of numerical\nsimulation obtained using the scattering matrix technique, are analyzed and\nexplained in terms of wave reflection at a curved dielectric interface combined\nwith the examination of Poincare surface of sections in the classical ray\npicture.",
    "arxiv_id": "physics/0305111",
    "authors": [
      "A. I. Rahachou",
      "I. V. Zozoulenko"
    ],
    "categories": [
      "physics.optics"
    ],
    "doi": "10.1063/1.1625781",
    "title": "Effects of boundary roughness on a Q-factor of whispering-gallery-mode   lasing microdisk cavities",
    "url": "https://arxiv.org/abs/physics/0305111"
  },
  "schema_id": "dorsal/arxiv",
  "source": {
    "execution_id": "50ffaa34-18ae-482a-a860-0a821bb3afb6",
    "id": "arXiv Dataset IDs",
    "type": "Model",
    "variant": "snapshot-2026-03-01",
    "version": "0.1.0"
  },
  "user_id": 1000002
}