dorsal/arxiv
View SchemaDevelopment of Ground-testable Phase Fresnel Lenses in Silicon
| Authors | John Krizmanic, Brian Morgan, Robert Streitmatter, Neil Gehrels, Keith Gendreau, Zaven Arzoumanian, Reza Ghodssi, Gerry Skinner |
|---|---|
| Categories | |
| ArXiv ID | physics/0601012 |
| URL | https://arxiv.org/abs/physics/0601012 |
| DOI | 10.1007/s10686-006-9030-9 |
| Journal | Exper.Astron.20:299-306,2005 |
Abstract
Diffractive/refractive optics, such as Phase Fresnel Lenses (PFL's), offer the potential to achieve excellent imaging performance in the x-ray and gamma-ray photon regimes. In principle, the angular resolution obtained with these devices can be diffraction limited. Furthermore, improvements in signal sensitivity can be achieved as virtually the entire flux incident on a lens can be concentrated onto a small detector area. In order to verify experimentally the imaging performance, we have fabricated PFL's in silicon using gray-scale lithography to produce the required Fresnel profile. These devices are to be evaluated in the recently constructed 600-meter x-ray interferometry testbed at NASA/GSFC. Profile measurements of the Fresnel structures in fabricated PFL's have been performed and have been used to obtain initial characterization of the expected PFL imaging efficiencies.
{
"annotation_id": "0337a1f7-ed33-4ced-8be0-ea84eda0fe83",
"date_created": "2026-03-02T18:01:03.667000Z",
"date_modified": "2026-03-02T18:01:03.667000Z",
"file_hash": "d29a1e862ae8fdc2558474b38bb3caeaffcde40d873e9b93f1fc6790262aa652",
"private": false,
"record": {
"abstract": "Diffractive/refractive optics, such as Phase Fresnel Lenses (PFL\u0027s), offer\nthe potential to achieve excellent imaging performance in the x-ray and\ngamma-ray photon regimes. In principle, the angular resolution obtained with\nthese devices can be diffraction limited. Furthermore, improvements in signal\nsensitivity can be achieved as virtually the entire flux incident on a lens can\nbe concentrated onto a small detector area. In order to verify experimentally\nthe imaging performance, we have fabricated PFL\u0027s in silicon using gray-scale\nlithography to produce the required Fresnel profile. These devices are to be\nevaluated in the recently constructed 600-meter x-ray interferometry testbed at\nNASA/GSFC. Profile measurements of the Fresnel structures in fabricated PFL\u0027s\nhave been performed and have been used to obtain initial characterization of\nthe expected PFL imaging efficiencies.",
"arxiv_id": "physics/0601012",
"authors": [
"John Krizmanic",
"Brian Morgan",
"Robert Streitmatter",
"Neil Gehrels",
"Keith Gendreau",
"Zaven Arzoumanian",
"Reza Ghodssi",
"Gerry Skinner"
],
"categories": [
"physics.optics",
"astro-ph"
],
"doi": "10.1007/s10686-006-9030-9",
"journal_ref": "Exper.Astron.20:299-306,2005",
"title": "Development of Ground-testable Phase Fresnel Lenses in Silicon",
"url": "https://arxiv.org/abs/physics/0601012"
},
"schema_id": "dorsal/arxiv",
"source": {
"execution_id": "b6a07c92-4f94-4eb7-b3d7-4f196468a233",
"id": "arXiv Dataset IDs",
"type": "Model",
"variant": "snapshot-2026-03-01",
"version": "0.1.0"
},
"user_id": 1000002
}