dorsal/arxiv
View SchemaDynamical analysis of the buildup process near resonance
| Authors | Jorge Villavicencio, Roberto Romo |
|---|---|
| Categories | |
| ArXiv ID | quant-ph/0011032 |
| URL | https://arxiv.org/abs/quant-ph/0011032 |
| DOI | 10.1063/1.126982 |
| Journal | Appl. Phys. Lett. Vol. 77, No. 3, 379 (2000) |
Abstract
The time evolution of the buildup process inside a double-barrier system for off-resonance incidence energies is studied by considering the analytic solution of the time dependent Schr\"{o}dinger equation with cutoff plane wave initial conditions. We show that the buildup process exhibits invariances under arbitrary changes on the system parameters, which can be successfully described by a simple and easy-to-use one-level formula. We find that the buildup of the off-resonant probability density is characterized by an oscillatory pattern modulated by the resonant case which governs the duration of the transient regime. This is evidence that off-resonant and resonant tunneling are two correlated processes, whose transient regime is characterized by the same transient time constant of two lifetimes.
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"abstract": "The time evolution of the buildup process inside a double-barrier system for\noff-resonance incidence energies is studied by considering the analytic\nsolution of the time dependent Schr\\\"{o}dinger equation with cutoff plane wave\ninitial conditions. We show that the buildup process exhibits invariances under\narbitrary changes on the system parameters, which can be successfully described\nby a simple and easy-to-use one-level formula. We find that the buildup of the\noff-resonant probability density is characterized by an oscillatory pattern\nmodulated by the resonant case which governs the duration of the transient\nregime. This is evidence that off-resonant and resonant tunneling are two\ncorrelated processes, whose transient regime is characterized by the same\ntransient time constant of two lifetimes.",
"arxiv_id": "quant-ph/0011032",
"authors": [
"Jorge Villavicencio",
"Roberto Romo"
],
"categories": [
"quant-ph"
],
"doi": "10.1063/1.126982",
"journal_ref": "Appl. Phys. Lett. Vol. 77, No. 3, 379 (2000)",
"title": "Dynamical analysis of the buildup process near resonance",
"url": "https://arxiv.org/abs/quant-ph/0011032"
},
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