dorsal/arxiv
View SchemaQuantum Imaging and Metrology
| Authors | Hwang Lee, Pieter Kok, Jonathan P. Dowling |
|---|---|
| Categories | |
| ArXiv ID | quant-ph/0306113 |
| URL | https://arxiv.org/abs/quant-ph/0306113 |
Abstract
The manipulation of quantum entanglement has found enormous potential for improving performances of devices such as gyroscopes, clocks, and even computers. Similar improvements have been demonstrated for lithography and microscopy. We present an overview of some aspects of enhancement by quantum entanglement in imaging and metrology.
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"abstract": "The manipulation of quantum entanglement has found enormous potential for\nimproving performances of devices such as gyroscopes, clocks, and even\ncomputers. Similar improvements have been demonstrated for lithography and\nmicroscopy. We present an overview of some aspects of enhancement by quantum\nentanglement in imaging and metrology.",
"arxiv_id": "quant-ph/0306113",
"authors": [
"Hwang Lee",
"Pieter Kok",
"Jonathan P. Dowling"
],
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"title": "Quantum Imaging and Metrology",
"url": "https://arxiv.org/abs/quant-ph/0306113"
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